INDIRECT METHOD OF TUNING OF STRAIN GAUGES WITH BRIDGE MEASUREMENT CIRCUIT BY MULTIPLICATIVE TEMPERATURE ERROR WITH ACCOUNT OF NEGATIVE NON-LINEARITY OF TEMPERATURE CHARACTERISTIC OF OUTPUT SIGNAL OF SENSOR Russian patent published in 2015 - IPC G01B7/16 

Abstract RU 2539816 C1

FIELD: measurement equipment.

SUBSTANCE: heat-dependent technological resistor Rαm is installed into a diagonal of bridge circuit power supply, the rating of which is higher than possible values of a compensating heat-dependent resistor Rα. In parallel to the resistor Rαm they install a link. They measure initial unbalance and output signal of the sensor under normal temperature t0, and also temperature t+, corresponding to upper limit of working range of temperatures, and t-, corresponding to lower limit of the working range of temperatures. On the basis of performed measurements they calculate temperature coefficient of frequency (TCF) of strain gauges of a bridge circuit α  meas + and α  meas at temperatures t+ and t-, accordingly, and also non-linearity of TCF of strain gauges of the bridge circuit ( Δ α  meas = α  meas + α  meas ) . They measure input resistance of a sensor bridge circuit. A heat-independent resistor Ri=0.5·Rinp is connected. They measure initial unbalance and output signal of the sensor at temperatures t0, t+ and t-. On the basis of completed measurements they calculate TCF of input resistance at t+ and t-. The resistor Ri is disconnected, and the link is removed off the resistor Rαm. They measure initial unbalance and output signal of the sensor at temperatures t0, t+ and t-. On the basis of completed measurements they calculate TCF of a process heat-dependent resistor Rαm at temperatures t+ and t-. If TCF of strain gauges of the bridge circuit and its non-linearity belong to the area of method application, they calculate the rating of the heat-dependent resistor Rα heat-independent resistor R with usage of produced values of TCF of strain gauges of a bridge circuit, TCF of input resistance and TCF of the technological heat-dependent resistor. The technological heat-dependent resistor Rαm is replaced with a resistor Rα by means of partial engagement. A resistor Rα is shunted with a heat-independent resistor R.

EFFECT: increased accuracy of compensation of multiplicative temperature error with account of negative non-linearity of temperature characteristic of an output signal of a sensor with usage of widely distributed measurement equipment.

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RU 2 539 816 C1

Authors

Tikhonenkov Vladimir Andreevich

Solujanov Denis Aleksandrovich

Dates

2015-01-27Published

2013-07-23Filed