DEVICE TO MEASURE DEFORMATIONS AND METHOD TO MEASURE DEFORMATIONS Russian patent published in 2015 - IPC G01L1/24 

Abstract RU 2540258 C1

FIELD: measurement equipment.

SUBSTANCE: device to measure deformations comprises two or more sensors of deformations, each of which may measure deformation and each of which is made so that it can be adapted for interaction with a structure that must be controlled, so that deformation of the structure may be detected with a deformation sensor, one or more points of position count, arranged in the specified position relative to two or more sensors of deformation. One or more points of position count are arranged so that they are suitable for interaction with a measuring facility. One or more measurement facilities are made as capable of interaction with one or more points of position count, so that angular orientation of one or more points of position count may be determined. The method of deformation measurement in the structure consists in detection of information, measurement of angular orientation, determination of angular orientation.

EFFECT: improved accuracy of deformation measurement.

15 cl, 4 dwg

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RU 2 540 258 C1

Authors

D'Jutojt Dana

Dates

2015-02-10Published

2012-01-11Filed