FIELD: measurement equipment.
SUBSTANCE: invention relates to optoelectronic instruments and can be used for measurement of tunnel profile. According to the method, a narrow light beam is shaped by means of an illumination unit, directed to the tunnel surface by means of a mirror inclined to the tunnel axis and belonging to the illumination unit; the tunnel profile cross-section is shaped in the form of sections in-series illuminated due to rotation of the above mirror; their images are recorded by means of a video camera and the optic axis of the video camera is directed into the centre of the annular zone of tunnel radius variation by means of the mirror belonging to the video camera. The video camera with its mirror is rotated about the tunnel axis synchronously with rotation of the mirror of the illumination unit. Then, images of sections are compared to sections of a standard profile and changes in profile cross-section radius are detected. The inclination angle of the optic axis of the video camera to the tunnel axis is determined by the formula: where R - cross-section radius of the standard tunnel profile; ΔR - width of the annular zone of radius variation of the tunnel profile cross-section; b - distance between the mirror of the illumination unit and the mirror of the video camera along the tunnel axis; φ1 - inclination angle of the mirror of the illumination unit to the tunnel axis.
EFFECT: reducing measurement error of a profile cross-section radius.
2 cl, 8 dwg
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0 |
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Authors
Dates
2015-12-10—Published
2013-11-15—Filed