METHOD OF MEASURING FULL RESISTANCE COMPONENTS AND DEVICE FOR ITS IMPLEMENTATION Russian patent published in 2017 - IPC G01R27/02 

FIELD: measurement technology; electricity.

SUBSTANCE: invention relates to measurement and control of the full resistance components and can be used to measure voltage on the poles contacts and to measure internal resistance of galvanic elements, various types of accumulators and batteries on their basis. Method is implemented by a device comprising microcontroller (1), generator (2), low-pass filter (element of protection from interference) (3), controlled current source (4), first multiplier (5), low-pass filter (element of protection from interference) (6), measuring circuit (7), second multiplier (8), low-pass filter (9), current meter (10), analyzed electrochemical power source (ECPS) (11). Generator (2) has two outputs, the first of which is the output of the first sinusoidal voltage, measuring circuit (7) connected to analyzed ECPS (11). To the output of the measuring circuit connected is filter (6), the output of which is connected to the first input of first multiplier (5). To the second output of generator (2) connected is the third input of first (5) and second (8) multipliers, the outputs of which are connected to measuring inputs of microcontroller (1). Besides, to the second output of generator (2) connected is filter (3), the output of which is connected to controlled current source (4), which sets the value of current flowing through analyzed ECPS (11). Second output of analyzed ECPS (11) is connected to current meter (10), which output via filter (9) is connected to second multiplier (8). Using this device determined are the active and the reactive components of the signal, they are fed to measuring inputs of the microcontroller, which by four signals calculates the active and the reactive components of full resistance of the analyzed ECPS.

EFFECT: technical result is improvement of accuracy of measuring components of the full ECPS resistance, which increases reliability of determining the ECPS defects.

2 cl, 1 dwg