FIELD: measuring equipment.
SUBSTANCE: invention relates to measuring equipment. Device includes a vacuum chamber, analyzed sample, mechanism to rotate the sample, two flat ohmic heaters with temperature sensors inside and heat flows. Determination of integral hemispherical emissivity of partially transparent materials is performed by measuring the density of flows of self-radiation of the sample by the heat flow sensors, which have preliminary been calibrated against the absolute black body model. Measuring consists in detecting the integral flow of the self-radiation of the sample at the equality of the temperatures of heaters.
EFFECT: technical result is the increase of the accuracy and reliability of the obtained results.
1 cl, 1 dwg
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