FIELD: control systems.
SUBSTANCE: group of inventions relates to means for controlling processes in process plants. Method for developing a projected lifetime profile for a component of a process control device comprises receiving an indication of at least one operating parameter of the component that effects aging of the component, over time, during operation of the process control device in a process installation; receiving in-service operating conditions the component is expected to experience during operation of the process control device; developing, in the profiler, an accelerated aging test protocol, based on the in-service operating conditions the component is expected to experience, where the accelerated aging test protocol is designed to simulate operation of the component to failure under the in-service operating conditions; receiving, from an accelerated test system, accelerated age testing data developed by performing at least one accelerated aging test protocol on a sample of the component; developing, in the profiler, a projected lifetime profile for the component based on the accelerated age testing data; receiving, on an operational data module during operation of the component in the process installation, measured data including data showing the operability of the component when used in the process installation or data showing the conditions experienced by the component during operation of the process control device when used in the process installation; and determining, on a lifetime determining device, the projected remaining lifetime of the component based on the projected lifetime profile and the measured data. Second version of said accelerated test method is also disclosed.
EFFECT: present inventions make it possible to predict the lifetime components taking into account their actual use.
19 cl, 8 dwg
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Authors
Dates
2018-09-04—Published
2014-03-14—Filed