FIELD: measuring equipment.
SUBSTANCE: invention relates to a measuring technique and can be used in atomic force microscopy for diagnosing nanoscale structures. Essence of the invention consists in the fact that the scanning probe contains a cantilever connected to a probe needle, which is threaded and rigidly fixed in one of the through nanopores of a larger-diameter glass sphere with quantum dots of the core-shell structure, and the tip of the probe needle, emerging from a glass sphere of larger diameter, is movably connected by means of two imbedded carbon nanotubes with the detachable and autonomously functioning glass sphere of small diameter with through nanopores, filled with quantum dots and magnetic nanoparticles with the same orientation of the core-shell structure poles. Components of the scanning probe are performed to be magnetically transparent and optically and magnetically transparent. Remote control of the excitation of the quantum dots of the core-shell structure and their autonomous movement along the Z coordinate when scanning the side walls of the nanochambers of the object being diagnosed is carried out with the help of two external counter-directed synchronized electromagnetic fields.
EFFECT: technical result is the ability to scan nanochambers at the Z coordinate, the depth of which is greater than the length of the probe needle, with simultaneous combination of spot thermal and electromagnetic with optical wavelength of impact on the walls of nanochambers with simultaneous measurement of mechanical characteristics of this stimulating effect at one point on the surface of the object of diagnosis with X, Y coordinates without affecting adjacent areas.
1 cl, 3 dwg
