METHOD OF CREATING REFRACTION INDEX STRUCTURES INSIDE A SAMPLE FROM TRANSPARENT MATERIAL AND A DEVICE FOR ITS IMPLEMENTATION Russian patent published in 2020 - IPC G02B6/02 G02B6/10 B23K26/82 

FIELD: optical instrument making.

SUBSTANCE: invention relates to optical instrument-making and relates to a method of creating a refraction index structure inside a sample from a transparent material. Structure is created by exposing the sample to a focused beam of femtosecond laser radiation. Simultaneously with feeding the radiation beam, the sample is scanned by forming an inclined beam incident on the aperture of the microlens by a given angle, determining the transverse dimension of the structure of the refraction index in the sample, and moving the sample in a direction perpendicular to the beam movement.

EFFECT: technical result consists in enabling possibility of changing the size of scanning area, increasing operating speed, reducing laser radiation energy required to create structures, increased scanning area, reduced losses caused by dissymmetry of waveguide cross section, increased accuracy due to absence of sagging effect of light guide.

8 cl, 6 dwg