FIELD: physics.
SUBSTANCE: invention relates to the super-high frequency (SHF) technology and can be used for reflectivity control of reflective materials during the manufacture process, for example, in materials used for manufacture of space antenna reflectors. The essence of the method: the reference and the measured samples are alternately installed onto the side wall of the wave guide. The transmission coefficients are measured, and the reflectivity of the material sample is determined as
wherein Gmeas, Gref are the reflectivities of the measured and reference samples, Ktrans meas and Ktrans ref are the measured transmission coefficients thereof.
EFFECT: simplification of apparatuses implementing the measurement method and reduction of their dimensions.
1 cl, 6 dwg
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Authors
Dates
2021-10-14—Published
2020-05-12—Filed