METHOD FOR MEASURING REFLECTIVITY OF REFLECTOR MATERIAL Russian patent published in 2021 - IPC G01R27/06 

Abstract RU 2757357 C1

FIELD: physics.

SUBSTANCE: invention relates to the super-high frequency (SHF) technology and can be used for reflectivity control of reflective materials during the manufacture process, for example, in materials used for manufacture of space antenna reflectors. The essence of the method: the reference and the measured samples are alternately installed onto the side wall of the wave guide. The transmission coefficients are measured, and the reflectivity of the material sample is determined as

wherein Gmeas, Gref are the reflectivities of the measured and reference samples, Ktrans meas and Ktrans ref are the measured transmission coefficients thereof.

EFFECT: simplification of apparatuses implementing the measurement method and reduction of their dimensions.

1 cl, 6 dwg

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RU 2 757 357 C1

Authors

Danilov Igor Yurevich

Romanov Anatolij Gennadevich

Nasybullin Ajdar Revkatovich

Sedelnikov Yurij Evgenevich

Dates

2021-10-14Published

2020-05-12Filed