FIELD: physics.
SUBSTANCE: invention concerns electric measurements and can be applied in manufacturing of existing and new absorbing materials of carbon plastic type, in SHF range, as well as in check of dielectric permittivity and dielectric loss angle tangent electric parameters. The device is designed for large-scale measurement of complex dielectric permittivity of highly absorbing materials at SHF, and features a p-waveguide, short-circuited at end, and a long lengthwise slot with matching cants in the side wall opposite to the edge, parallel to p-waveguide axis. The slit is as wide as whole p-waveguide wall, and during measurement it is screened by standard short-circuitor or sample under investigation.
EFFECT: higher accuracy of complex dielectric permittivity measurement for low-impedance composite materials.
3 dwg
