FIELD: measuring technology.
SUBSTANCE: invention can be used to measure temperatures or resistances of semiconductor and resistive strain gauges, temperature sensors, pressure sensors. The multichannel sensor parameter meter contains resistive sensors, the ninth sensor is equivalent in terms of the initial resistance of the sensors, the first and second 8-channel multiplexers, a power bus, the first, second, third, fourth, fifth, sixth and seventh resistors, an operational amplifier, a measuring receiver, a bus controls, stabilitron, first and second analog switches, two-channel current source, first and second capacitors, two-threshold voltage comparator.
EFFECT: expansion of functionality, expansion of dynamic range.
2 cl, 2 dwg
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Authors
Dates
2023-05-02—Published
2022-03-23—Filed