FIELD: measuring technology.
SUBSTANCE: invention is intended for measuring the temperature of a controlled object using a thermal resistance. The device can be used to measure the temperature parameters of mechanisms, liquids and gases and be used in aircraft, transport facilities, ships, etc. A device for measuring the temperature of a controlled object is claimed, which contains two identical, parallel-connected measurement channels, the main and the backup, in which stabilized currents flowing through a thermal resistance are formed, the resistance of which is proportional to the temperature of the controlled object. The main and backup channels are identical in their structure; each of them contains a stabilized current source, to the output of which a resistive current shunt is connected to measure the current. An instrumentation amplifier is connected to the outputs of the resistive current shunt. The output of the instrumentation amplifier is connected to the input of an analog-to-digital converter (hereinafter - ADC) built into the microcontroller. The current shunt is connected to the drain of a switch made on a field-effect transistor with a low channel resistance. The gate of the transistor switch is connected to the output of the microcontroller. The source of the transistor is connected to one of the extreme terminals of the thermal resistance. The source of the transistor of another (reserve) measurement channel is connected to the same output, the circuit of which is completely identical. The other output of the thermal resistance is connected to the common output of the measuring device.
EFFECT: increase of reliability of formation of stabilized currents flowing through the thermal resistance, and an increase in the reliability of the measurement results.
1 cl, 1 dwg
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Authors
Dates
2023-05-17—Published
2023-01-09—Filed