METHOD FOR ESTIMATING STABILIZATION PARAMETERS OF OPTOELECTRONIC SYSTEMS Russian patent published in 2024 - IPC G01C25/00 G01M7/06 

FIELD: physics.

SUBSTANCE: invention relates to stabilization of optoelectronic systems. Method for estimating stabilization parameters of optoelectronic systems includes installation of a test item with a gyrostabilized platform, with optical channels and a control flat mirror, on the site of the stand of sinusoidal oscillations, while its Y and Z axes are parallel to the Y and Z axes of the stabilization system, a scale-coordinate paper is installed at a distance from the flat mirror, the article stabilization system is switched to the operating mode, the laser beam of the external source is directed to the control mirror so that the beam reflection falls on the paper, the optical channels aiming at the laser spot on the paper is checked, diameters of the laser spot are measured in the plane of the Y axis (dy) and the Z axis (dz), sinusoidal oscillations of the stand are generated along the X, Y and Z axes, and at the same time the double amplitude of the maximum deviation of the beam in the plane of the Y axis (Ay) and the Z axis (Az) is measured on paper, then the maximum stabilization error along the Y axis (ΔY) and Z axis (ΔZ), measurements and calculations for other oscillation parameters are repeated, then for each of the axes the root-mean-square error of stabilization is calculated (σ).

EFFECT: high accuracy in conditions close to real ones.

3 cl, 6 dwg