FIELD: testing technology. SUBSTANCE: program of tests is generated in form of voltage at output of integrator 9. Timer 10 controls connection and disconnection of switches 2, 4, 6 and 14 through frequency divider 11 and pulse distributor 12; signals from maximum temperature setter 1 or from minimum temperature setter and from heating rate setters 5 or 13 respectively are furnished to inputs of relay element 7 and multiplying unit 8. EFFECT: extended functional capabilities of device and forming of test programs of various complexity. 2 dwg
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