FIELD: analysis of materials. SUBSTANCE: analyzer has X-ray tube 1, slot 2 mounted along path of the beams. Projection 3 of the slot is disposed onto the working surface 4 of sample holder. Fluorescent radiation source 5-6 arises from influence of primary radiation. Slot with selective filters 8-10 is mounted in perpendicular to projection 3. The slot is disposed between projection 3 and coordinate-sensitive detectors in such a manner that radiation from points 5 and 6 transmits through windows of the detectors in points 14-16 for points 5 and in points 17-19 for point 6. Signals are processed in the computer. EFFECT: improved precision. 1 dwg
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