FIELD: automated devices for control of integrated circuits in group testing. SUBSTANCE: device has contacting block 1, comparator block 3, reference voltage block 4, control block 6, voltage source 8. Introduction of switching block 2, analyzer 5 and pulse signal shaper 7 into the device makes it possible to use it for control of quality of contact of integrated circuits in performance of group testing (e.g., electric thermal aging) in dynamic mode. EFFECT: higher confidence of control. 2 cl, 4 dwg
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