METHOD OF MEASURING ELECTRO-PHYSICAL PARAMETERS OF MATTER BY MEANS OF CONDUCTIVITY APPARATUS Russian patent published in 1995 - IPC

Abstract RU 2045052 C1

FIELD: material science. SUBSTANCE: sample is subjected to influence of variable strength magnetic field, as well as microwave field with variable area. Electric-resistive parameter is measured depending on variable parameter of acting field. Characteristics desired are computed from the relations. EFFECT: improved precision. 4 cl, 4 dwg

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RU 2 045 052 C1

Authors

Loshkarev G.L.

Dates

1995-09-27Published

1992-12-15Filed