FIELD: electricity.
SUBSTANCE: device to measure life time of minority charge carriers in semiconductors comprises a controlled microwave unit, a controlled measurement unit with a microwave resonator, and also a unit to control automatic calibration and measurement with application of a computer. At the same time the microwave resonator is made in the form of a cylindrical dielectric resonator, at one side of which there is a semiconductor laser diode fixed, and between the end surfaces of the dielectric resonator coaxially with the cylinder axis there is a through hole arranged, through which the laser diode emits.
EFFECT: higher accuracy and reliability of measurements for life time of minority charge carriers in semiconductors with a contact-free microwave method.
1 dwg
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