FIELD: instruments. SUBSTANCE: device has measuring chamber which has active element, microwave detector and microwave filter which is located between microwave detector and active element. One input of gate is connected to microwave detector, second input of gate is connected to high- frequency detector, output is connected to input of amplifier with controlled gain. EFFECT: possibility to measure thickness and dielectric permeability of dielectric material. 1 dwg
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Authors
Dates
1997-11-20—Published
1995-09-07—Filed