AUTOMATED DEVICE MEASURING PARAMETERS OF MATERIALS Russian patent published in 1998 - IPC

FIELD: measurement technology. SUBSTANCE: automated device measuring parameters of materials is related to SHF equipment and has SHF generator which output is connected to first arm of circulator which second arm is connected to one end of waveguide section where semiconductor switch based on p-i-n diode is placed and which third arm is connected to detector whose output is connected to information input of measurement and control unit. Other end of waveguide section is connected to radiator manufactured in the form of sectorial horn in which aperture microswitches of light indicator are positioned for provision of control over density of contact of aperture of horn with surface of tested material. Measurement and control unit is built on base of microprocessor and is connected through external input-output interface by controlling networks to SHF generator, semiconductor switch, light and liquid crystal indicators and unit recording measurement results. EFFECT: enhanced operational reliability and stability of device. 5 cl, 7 dwg