PROCESS OF ADJUSTMENT OF DIFFRACTOMETER Russian patent published in 1998 - IPC

FIELD: diffraction measurements. SUBSTANCE: two edge screens are installed in opposition on rotation axes of sample and crystal-monochromator, analytical slit is located in front of detector. Positions corresponding to penumbras ( twice as much drop of intensities ) from edge screens are determined by scanning detector over circumference of goniometer and fixing angles αм1

and αo1 on goniometer scale. Then X-ray source is moved towards working edge of edge screen mounted on axis of flat crystal-monochromator till detector located in position corresponding to penumbra from another edge screen registers penumbra from first edge screen. After this detector is moved to formation of penumbra from edge screen installed on axis of sample and operations of movement of X-ray source and registration of detector angles are repeated till equality of angles αмп and αoк is achieved. Then edge screen mounted on rotation axis of crystal- monochromator is removed and collimator is adjusted, after this bracket of X-ray radiation source is moved towards goniometer as far as it goes and symmetry of positioning of primary beam with reference to edge screen mounted on rotation axis of sample and vertical axis of analytical slit is checked. EFFECT: increased accuracy of adjustment of diffractometer.