FIELD: X-ray equipment. SUBSTANCE: diffractometer is based on Debye-Scherrer circuit. It employs several collimators with arc-shaped slits. Profile of each slit is oriented in compliance with that range of diffraction angles to which corresponding channel is tuned which enables to get rid of mechanical orientation of slits. Spectrum scanning is realized by way of simple rectilinear motion of specimen. EFFECT: functional reliability of multichannel X-ray diffractometer and simplicity of its handling. 3 cl, 5 dwg
| Title | Year | Author | Number |
|---|---|---|---|
| METHOD AND DEVICE FOR PERFORMANCE OF X-RAY ANALYSIS OF SAMPLE | 2010 |
|
RU2506570C1 |
| 0 |
|
SU1562808A1 | |
| SUPERPOSITION RING DIFFRACTOMETER | 2023 |
|
RU2808954C1 |
| X-RAY ANALYSIS DEVICE | 2008 |
|
RU2450261C2 |
| X-RAY DIFFRACTOMETRIC METHOD | 0 |
|
SU911264A1 |
| X-RAY REFLECTOMETER | 1999 |
|
RU2166184C2 |
| METHOD FOR STRUCTURAL INSPECTION OF SEMICONDUCTOR MULTILAYER STRUCTURE (VARIANTS) | 2010 |
|
RU2442145C1 |
| DEVICE FOR RECORDING X-RAY DIFFRACTION PARAMETERS OF CRYSTAL WHEN EXPOSED TO LASER RADIATION | 2023 |
|
RU2830098C1 |
| METHOD OF PERFORMING X-RAY DIFFRACTION ANALYSIS | 0 |
|
SU1288563A1 |
| X-RAY DIFRACTOMETER | 0 |
|
SU1427263A1 |
