FIELD: study of small particles. SUBSTANCE: first laser 4 emits beam in first wave range that is focused with the aid of first optical fixture 12, 13, 14, 15 and forms first optical trap.Microscopic stage 22 is used to locate corresponding particles. Illumination source 17 is provided for observation and recording of behavior of particles. Second laser 3 emits beam in second wave range that focused to act on particles on microscopic stage. Optical fixtures for each beam can be positioned and focused independently. Before start of manipulation and action beams are focused on one and same object plane of microscopic stage independently of lengths of waves. EFFECT: improved reliability of device. 19 cl, 1 dwg
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