FIELD: testing equipment. SUBSTANCE: plant testing for radiation resistance has X-ray source, high-voltage power supply unit, desk controlling supply unit, sensor of intensity of X-ray radiation with output of control signal, board with contact panel connecting tested object to plant which number of contacts is greater than number of leads-out of tested object, control computer with built-in software, controller coupling control computer, unit studying static characteristics of object, unit matching and commutating contacts of above-mentioned board having one input of control signal from sensor of intensity of X-ray radiation, at least one input of voltage from power supply source of tested object and one output of measured signals, at least two outputs of voltage from power supply source and two inputs of measured signals and inputs/outputs of signals from unit studying static characteristics. Apart from these connections inputs/outputs of control computer are connected to outputs/inputs of coupling controller which other inputs/outputs are connected to outputs/inputs of unit studying static characteristics, one electric measurement device as minimum and source of power supply connected to proper output and input of matching unit. Sensor of intensity of X-X-ray radiation is installed during test of plant on axis of X-ray radiation at point of installation of board for connection of tested object. EFFECT: automatic study of resistance of energized semiconductor devices and integrated circuits in working state. 14 dwg
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Authors
Dates
1999-03-27—Published
1997-01-23—Filed