DEVICE FOR MEASURING ANGULAR DISTRIBUTION OF ION BEAM Russian patent published in 1999 - IPC

FIELD: studies of ion-nuclear collisions, primarily interaction of ion beam with single-crystalline or gas target, surface treatment with ion beam. SUBSTANCE: device has eight-bit binary reversing counter whose outputs are connected to eight-bit adder. Second input of adder is connected to programmable memory enabling shifting of adder output code. Memory address inputs enabling shifting of adder output code are connected to multiplexer through which they are connected either to reversing counter or to microprocessor controller. Connected to memory is also reversing counter control circuit. Nine-bit code picked off adder is passed to external storage and to digital-to-analog converter wherefrom signal goes to deflecting plates through paraphase-outputs amplifier. Ions passed between plates deflect from initial path and enter recording detector with the result that code corresponding to deflection angle is memorized in storage device. Second digital-to-analog converter that sets reference voltage for first one is used for output signal scaling. Microprocessor controller functions to control second digital-to- analog converter, multiplexer, and programmable memory and to generate clock pulses for counter. In this way, programmable linear- and-stepped deflection of ion bean is attained. EFFECT: improved efficiency of studies and improved local strength of treated parts. 1 dwg