PROCESS DETECTING FLAWS OF SURFACE Russian patent published in 1999 - IPC

FIELD: instrumentation, detection of flaws of various origin on surface of parts: mechanical, color, foreign inclusions in structure of material of parts. SUBSTANCE: luminous flux is directed on to surface of tested part to detect flaws on surface of part, specularly and diffusively reflected luminous fluxes are recorded discretely and converted into electric signals in points of surface interval between which does not exceed average distance between ridges of microroughnesses for given class of parts. Samples of recorded luminous fluxes of n volume that is found for flawless surface are determined. Evaluations of dispersions of specular and diffusive components are measured per each sample of n volume, their product is computed and its value is used to estimate presence or absence of flaws on surface of part. EFFECT: increased reliability of flaw detection by usage of parameter characterizing presence of defects and equal to product of evaluations of dispersions of specular and diffusive components. 1 dwg