FIELD: spectral analysis. SUBSTANCE: salient feature of proposed process lies in registration of system of nodes and antinodes of intensity of electric field of standing light wave on periodic lattice structure formed by lines of thin photoelectric or photoluminescent layer partially transmitting light and stripes located between lines. Angle θ included between plane of periodic lattice structure and wave front of light wave is set from relation sinθ = λ/2d, where λ is length of light wave; d is period of periodic lattice structure. Proposed spectrometry process is realized with the aid of interferometers equipped with photosensitive periodic lattice structure placed between light radiation source and reflecting mirror. Technical result of process lies in expanded working measurement range with conservation of high transmission rate. Besides that one of proposed interferometers can be employed in the capacity of optical switch in optical communication systems and in design of optical computer. EFFECT: expanded working measurement range with conservation of high transmission rate. 8 cl, 6 dwg
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