PROCEDURE OF PROCESSING OF SIGNALS CHARACTERIZING WAVES REFLECTED OR TRANSMITTED BY OBJECT FOR EXAMINATION AND ANALYSIS OF STRUCTURE OF OBJECT AND DEVICE FOR EXAMINATION AND ANALYSIS OF STRUCTURE OF OBJECT Russian patent published in 2002 - IPC

FIELD: analysis of structure of object. SUBSTANCE: procedure and device are designed to process signals characterizing waves reflected or let through by certain object (0) to conduct analysis of structure of this object. Procedure includes radiation of waves incident on specified object, reception of waves reflected or let through by structures found in path of incident wave inside object by number of detecting elements (D₁,D_n); conversion of obtained information to digital form with its subsequent recording in field storage (MC); computation of positions of cells per each point (P_ij) of object which are engaged in field storage by signals detected by specified elements (D_l,D_n) and by corresponding waves which are reflected or let through by point (P_ij) and finally execution of operations with all data related to each point (P_ij) and contained in field storage (V_p) which will allow amplitude of wave reflected or let through by point (P_ij) to be determined. EFFECT: simplification of examination procedure and analysis of structure of object. 17 cl, 2 dwg