PROCEDURE TESTING INTERNAL ELECTRIC NETWORKS OF ELECTRODES OF ELECTRONIC DEVICES Russian patent published in 2003 - IPC

FIELD: electrical engineering, equipment testing electronic devices. SUBSTANCE: parameters of test in accordance with given procedure testing internal electric networks of electronic device with internal and external current-conducting surfaces are determined by means of additional electrode by way of successive positioning of additional electrode in two adjacent zones in . area of internal network of tested electrode of electronic device. Obtained values of parameters are compared with parameter-criterion established beforehand. Frequency F of alternating voltage fed to outer lead of internal electrode is chosen from relation 2/RC≥F≥1/RC, where R is physically specified value of resistance of internal network of tested electrode; C is physically specified value of capacitance between internal currentconducting network of tested electrode and external current-conducting surface of device. EFFECT: increased accuracy of diagnostics of device. 3 dwg