METHOD FOR CONTINUOUS CONTROL OF THICKNESS OF LAYERS OF BIMETAL WITH FERROMAGNETIC BASE Russian patent published in 2003 - IPC

FIELD: monitoring and measuring technique, possibly continuous thickness measuring of layers of sheet and coiled bimetal of electrically conductive and ferromagnetic materials. SUBSTANCE: method comprises steps of acting upon bimetal by means of magnetic field excited by inductor with =-shaped magnetic circuit; placing inductor with gap at side of ferromagnetic layer; arranging screening measuring coil over inductor at opposite side of bimetal; arranging second reference inductor and second screening reference coil similarly relative to gage; connecting screening measuring coil and reference coil, secondary windings of inductors respectively in series and mutually opposite; determining fluctuation of thickness of bimetal layers according to change of voltages of screening measuring coil and secondary winding of inductor relative to voltages of screening reference coil and secondary winding of reference inductor. EFFECT: enhanced accuracy of measuring thickness of bimetal layers at rolling process, enlarged functional possibilities and enlarged using range. 1 dwg