FIELD: analytical chemistry. SUBSTANCE: method includes irradiation of sample of analyzed substance with gamma or X radiation, recording of intensities of characteristic line of established element and of primary radiation scattered by sample. Then precise value of optimal surface density of absorber at which most complete registration of matrix effect takes place is computed with use of obtained analytical expression relating optimal surface density of additional absorber from analyzed substance and measured intensities. Later additional absorber of computed surface density is placed between analyzed sample and detector and intensity of characteristic line of established element in direct measurement and intensity of primary radiation passed through additional absorber and scattered by sample are recorded. Concentration of established element in analyzed sample is computed by analytical signal presenting ratio of above-mentioned intensities. EFFECT: raise measurement accuracy. 3 dwg
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Authors
Dates
2003-11-27—Published
2001-12-13—Filed