FIELD: X-ray fluorescent analysis.
SUBSTANCE: invention is used for X-ray fluorescence analysis to determine the concentration of the elemental composition of the substance. The essence of the invention consists in measuring the spectrum of characteristic radiation over the entire range of energies corresponding to the analytical lines of the elements contained in the sample simultaneously with the intensity of incoherently scattered radiation, while approximating the background formed by incoherently scattered radiation, eliminating the background formed by incoherently scattered radiation, determining the first statistical moment for each energy, determining the second statistical moment for each energy, the spectrum of the characteristic radiation is normalized according to the transformed intensities of incoherently scattered radiation.
EFFECT: increased sensitivity.
1 cl, 2 dwg
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