METHOD AND DEVICE FOR MEASURING THICKNESS OF GLASS VESSEL WALL Russian patent published in 2004 - IPC

Abstract RU 2243501 C2

FIELD: measuring engineering.

SUBSTANCE: method comprises measuring intensity of radiation emitted on first wavelength whose intensity depends on the surface temperature and thickness of the wall between the surfaces and on the second wavelength whose intensity depends only on surface temperature and is independent of the wall thickness between the surfaces. The thickness of the wall is determined from a combined function of the first and second intensities.

EFFECT: enhanced accuracy of measuring.

21 cl, 9 dwg

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RU 2 243 501 C2

Authors

Dzhuvinoll Dzhon V.

Ringlin Dzhejms A.

Dates

2004-12-27Published

2000-01-11Filed