X-RAY SURFACE ANALYZER Russian patent published in 2005 - IPC

FIELD: non-destructive inspection of porous structure of abrasive tool strings.

SUBSTANCE: X-ray surface analyzer has X-ray radiation source, crystalline resonator - for generating monochromatic X-ray radiation, crystalline mirrors for separating and changing direction of propagation of X-ray radiation, focusing crystalline systems - collimators for registering medium-crystal-analyzer for creating interference of waves which passed different routes. One of two X-ray beams having opposite direction than the other being a reference one, is directed by diffraction optics unit system onto registering medium, which has to crystal-analyzer. The system has crystalline mirror and collimator. The other beam of X-ray radiation, which has to be the object beam when passing through collimator along the other route, falls onto object that produces a hologram to be registered. Then the beam passes one more collimator, reflecting microscope and falls onto crystal-analyzer. Image tube is used for measurements. Magnification of three-dimensional interference pattern is carried out due to reflective X-ray microscope while registering holographic image of micro-relief of porous structure of abrasive tool strings.

EFFECT: improved precision of measurements; reduced efficient time for micro-relief profile registration.

1 dwg