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Application

2004105008/28, 2004-02-20

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Start date

2004-02-20

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Actual filing date

2004-02-20

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Published

2005-10-27

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Inventor

Makhutov N.A.Tutnov A.A.Getman A.F.Lovchev V.N.Gutsev D.F.Kurakov Ju.A.Dragunov Ju.G.Zubchenko A.S.Grigor'Ev M.V.Kaliberda I.V.Nigmatulin B.I.Karzov G.P.Vasil'Ev V.G.Prosvirin A.V.Konev Ju.N.Tutnov A.A.Tarasenkova G.I.Vasil'Chenko G.S.

(73)

Holder

Zakrytoe Aktsionernoe Obshchestvo Tsentr Po Nadezhnosti, Bezopasnosti I Resursu Oborudovanija I Truboprovodam Atomnykh Ehlektrostantsij"

METHOD OF DETERMINING PRESENCE OF DEFECTS AFTER NONDESTRUCTIVE TESTS Russian patent published in 2005 - IPC

Abstract RU 2263296 C1

FIELD: investigating or analyzing materials.

SUBSTANCE: method comprises determining confidence level of the testing method used from the probability of finding defects, which ranges in a definite intervals of their sizes, determining the number of defects after each nondestructive testing that fall into the definite size interval, removing defects, and calculating the number of defects that fall into the definite interval of sizes.

EFFECT: enhanced reliability.

4 dwg

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RU 2 263 296 C1

Authors

Makhutov N.A.

Tutnov A.A.

Getman A.F.

Lovchev V.N.

Gutsev D.F.

Kurakov Ju.A.

Dragunov Ju.G.

Zubchenko A.S.

Grigor'Ev M.V.

Kaliberda I.V.

Nigmatulin B.I.

Karzov G.P.

Vasil'Ev V.G.

Prosvirin A.V.

Konev Ju.N.

Tutnov A.A.

Tarasenkova G.I.

Vasil'Chenko G.S.

Dates

2005-10-27—Published

2004-02-20—Filed

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