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2 269 179

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(51)

IPC

H01J49/34(2006-01-01)

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Application

2001124019/28, 2001-08-29

(24)

Start date

2001-08-29

(22)

Actual filing date

2001-08-29

(45)

Published

2006-01-27

(72)

Inventor

Sheretov Ehrnst PantelejmonovichIvanov Vladimir Vasil'EvichKarnav Tat'Jana BorisovnaFilippov Igor' Vladimirovich

(73)

Holder

Sheretov Ehrnst Pantelejmonovich

METHOD FOR ANALYZING IONS BY SPECIFIC CHARGES IN HYPERBOLOID MASS SPECTROMETER OF TYPE "THREE-DIMENSIONAL TRAP" INCLUDING INTRODUCTION OF IONS BEING ANALYZED FROM OUTSIDE Russian patent published in 2006 - IPC H01J49/34

Abstract RU 2269179 C2

FIELD: hyperboloid mass spectrometry; developing high-resolution and high-sensitivity devices.

SUBSTANCE: proposed method for analyzing ions by specific charges in hyperboloid mass spectrometer of "three-dimensional ion trap" type includes introduction of ions into working space of analyzer, their entrapping by field, sorting out according to specific charges, followed by heir delivery to inlet of ion detector; ions are entrapped selectively by setting high-frequency supply voltage amplitude, and/or waveform, and/or frequency at which working point of ions being analyzed on stability diagram of at least one of coordinates on iso-β₀ line corresponding to β₀ =0 value, where β₀ is parameter of stability.

EFFECT: enhanced precision of analyzing ions by specific charges.

1 cl, 3 dwg

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RU 2 269 179 C2

Authors

Sheretov Ehrnst Pantelejmonovich

Ivanov Vladimir Vasil'Evich

Karnav Tat'Jana Borisovna

Filippov Igor' Vladimirovich

Dates

2006-01-27—Published

2001-08-29—Filed