FIELD: physics.
SUBSTANCE: method of analysing charged particles (ions) in hyperboloid mass spectrometers relates to hyperboloid mass spectrometry and can be used in designing high-resolution and high-sensitivity analytical devices. High sensitivity is achieved due to that at resolutions of a few hundreds of thousands, it was possible to find a level where the number of selected ions held in the volume of the analyser reaches 40%. Analysed charged particles are fed into the analyser of a mass spectrometer, sorted according to specific charge by exposing them to a high-frequency electrostatic field with a constant component, thereby forcing ions with the selected specific charge to move on "basic trajectories", and ions with specific charge different from the selected value are removed from the working volume at field-setting electrodes of the analyser, after which the remaining ions in the volume of the analyser with the selected specific charge value are directed into a measurement device. The operating point of ions with the selected specific charge on the general stability diagram, through selection of parameters of the electrostatic field, are placed on a line perpendicular to the axis of the general stability diagram, passing through the point of intersection of said axis with the boundary of the stability zone, which corresponds to the value of the stability parameter β0=-1, wherein on another coordinate axis, the working point is located in one of the stable regions of the general stability diagram.
EFFECT: high resolution owing to use of regions of the general stability diagram with high efficiency of sorting charged particles according to specific charge.
5 dwg
