CORONA DISCHARGE IONIZATION SOURCE FOR DEVICES DETECTING MICROSCOPIC IMPURITIES OF MATTER IN GASES Russian patent published in 2006 - IPC G01N27/68 

FIELD: determination of micro-impurities of matter in gases.

SUBSTANCE: analytical head for detecting microscopic impurities in gases has through channel which has in turn the ionization chamber made of inlet branch along which branch the gas to be analyzed is supplied and ionization source introduced inside, device for selecting ions in mobility made in form of drift gap which is formed by central potential electrode and external earthed electrode disposed coaxially. Electrodes are connected with constant compensating and alternate asymmetric voltage sources and ion collecting system. Ionization chamber is brought into coincidence with input part of drift gap and it is formed by inlet branch pipe, ionizing electrode introduced inside branch pipe, and central electrode. Ionizing electrode is mounted at entrance end of central electrode along its axis and it is electrically connected with it either it is introduced inside inlet branch pipe through its wall and through insulator at angle to internal surface of inlet branch pipe.

EFFECT: improved sensitivity of detection of microscopic impurities in gas.

2 dwg