HIGH TEMPERATURE ADAPTER FOR ELECTRON DIFFRACTOGRAPH Russian patent published in 2008 - IPC G01N23/00 

FIELD: physics; measurements.

SUBSTANCE: invention can be used for analysing the structure of regular and textured objects with nano-size structural imperfections. The essence lies in that, the high temperature adapter for electron diffractograph for analysing samples, as on reflection and in illumination mode with simultaneous heating up to 300°C, is made with provision for examining samples with area of up to 100 mm². In the illumination mode, the angle of incidence of the electron beam is about 70 degrees relative the plane of the sample. The high temperature adapter consists of a carrying plate, on which is fixed the bearing of the axis of rotation of the conical gear, mated with the pinion gear, integrated with the case of the furnace. On the upper plane of the case the sample plate is fixed. The rotating case has of a coil of a heating element inside, the external terminals of which freely pass along the carrying plate, enabling the case to rotate by 360 degrees about the axis of the opening, through which the beam of accelerated electrons passes. The case of the furnace is fixed to the opening of the carrying plate through a washer. The formation of a holder, allows analysing the diffraction image of fast electrons on flat samples with diameter not less than 10 mm with simultaneous heating to 300°C and rotation of up to 70 degrees relative the plane of the sample.

EFFECT: formation of a holder, which allows analysing the diffraction image of fast electrons on flat samples.

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