ELECTROOPTICAL DIFFRACTION MEASURING DEVICE Russian patent published in 1999 - IPC

FIELD: electronic equipment, which displays electron-diffraction pattern with pico- or femtosecond resolution, in particular, for investigations in physics, chemistry, biology, medicine, instruments and industry. SUBSTANCE: device has vacuum chamber which contains serial circuit of photo cathode, focusing system, anode diaphragm, electronic shutter, travelling wave deviation system, unit of targets, detector of electron image and reading system using CCD matrix. In addition to accelerating and focusing electrodes, focusing system has correcting electrode. Parameters of electrodes are in fixed proportion to each other, in order to provide optimal section of electron beam in plane of target under investigation. Planes of target and crossover are joined. This results in focusing of photo cathode image and diffraction pattern in plane of output screen. Housing also has optical windows for supply of laser beams in synchronization with electron pulse to target, which is located in unit of targets which is designed as device with sockets for mounting samples under investigation. EFFECT: increased temporal resolution (down to hundreds of femtoseconds), increased functional capabilities. 4 cl, 1 dwg