FIELD: electronics.
SUBSTANCE: suggested device contains ramp voltage generator the output of which is connected to terminal for analysed semiconductor device connection, logarithmic amplifier, analog-digital converter, digital-analog converter, computer, monitor, amplifier control circuit and control and triggering circuit for ramp voltage generator. Output terminal of analysed semiconductor device is connected with first input of logarithmic amplifier the output of which is connected to input of analog-digital converter, and output of analog-digital converter is connected to computer. Computer is connected with input of digital-analog converter, the output of which is connected to input of amplifier control circuit and at the same time - with control and triggering circuit for ramp voltage generator. The output of this circuit is connected to input of ramp voltage generator. Output of amplifier control circuit is connected to second input of logarithmic amplifier.
EFFECT: provides widening of functionality and automation for measuring procedure and can be used for recording imperfectness characteristics of semiconductor devices with the help of computer.
1 dwg
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