SURFACE DEFECT DETECTOR AND TESTER Russian patent published in 2008 - IPC G01B11/24 

FIELD: physics.

SUBSTANCE: surface defect detector and tester contains cylindrical body with longitudinal series in-build panoramic wide-angle lens, lighthead consisting of light-emitting diodes around panoramic wide-angle lens in plane perpendicular to its optical axis, and CCD matrix in focal plane of panoramic wide-angle lens. The system additionally contains side look and measurement gate consisting of side look lens optical axis of which is perpendicular to longitudinal axis of the cylindrical body and of the additional CCD matrix in focal plane of side look lens, as well as of additional lighthead of side look gate consisting of light-emitting diodes around side look lens in plane perpendicular to its optical axis and two band light sources mutually orthogonal in plane perpendicular to side look lens axis, planar light beam of which are inclined to normal of object surface at its crosspoint with beams axes at an angle 45°, projecting two mutually orthogonal slit images on surface of controlled object. The system also contains scanner providing independent motion and corotation of slit images in plane perpendicular to side look lens axis, computer for monitoring and processing of defect images, registering and storage of measurement results.

EFFECT: possibility to detect and measure surface defects simultaneously in any two mutually perpendicular sections; to perform computer processing of digital defect images; to register and store measurement results.

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