METHOD FOR FOCUSING OF SYNCHROTRON RADIATION Russian patent published in 2009 - IPC G01N23/20 

FIELD: physics, optics.

SUBSTANCE: application: for focusing of synchrotron radiation. Substance: consists in the fact that serial Bragg reflection of SR beam is carried out from crystalline monochromator, and full external reflection (FER) is realised from focusing mirror with permanent radius of cylindrical surface R and distance between mirror and focus q during installation of monochromator at Bragg angle θ_m to beam, of mirror - at an angle α, which does not exceed critical angle of mirror FER, at that angle α of mirror incline to beam and Bragg angle of monochromator θ_m are established according to the following formulas: α=2q/R[1+q(P₀/b+l₀)^-1], tgθ_m=qtgθ₀(p₀/b+l₀)^-1, where p₀ is distance between source of radiation and monochromator, l₀ is distance between monochromator and mirror, b is factor of monochromator asymmetry, θ₀ is Bragg angle that corresponds to selected reflex of investigated sample.

EFFECT: provision of possibility to control dispersion of focused X-ray beam (synchrotron radiation) and, as a result, provision of dispersion-free diffraction of X-ray beams (synchrotron radiation) on sample.

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