X-RAY DIFFRACTION APPARATUS AND X-RAY DIFFRACTION METHOD Russian patent published in 2012 - IPC G01N23/207 

FIELD: physics.

SUBSTANCE: X-ray diffraction apparatus has a mirror (18), having a reflecting surface (19) which is formed such that the angle in the plane parallel to the diffraction plane between the tangential line (38) of the reflecting surface (19), at any point on the reflecting surface (19), and the linear section (36) which connects any point and a sample (26) becomes constant and the crystal lattice plane which causes reflection is parallel to the reflection surface (19) at any point on the reflection surface (19); the X-ray detector (20) is one-dimensional, position-sensitive in the plane parallel to the diffraction plane; and the relative position of the mirror (18) and the X-ray detector (20) is defined in the plane parallel to the diffraction plane such that reflected X-ray beams (40) from different points on the reflecting surface (19) of the mirror (18) reach different points on the X-ray detector (20), respectively.

EFFECT: improved angular resolution, negligible reduction in X-ray intensity and simple design.

13 cl, 14 dwg