METHOD FOR MASS SELECTIVE ANALYSIS OF IONS ON FLIGHT TIME IN LINEAR RF FIELD AND DEVICE FOR REALISING SAID METHOD Russian patent published in 2009 - IPC H01J49/22 

Abstract RU 2367053 C1

FIELD: physics.

SUBSTANCE: invention relates to mass selective analysis of charged particles in two-dimensional linear RF fields. The method for mass selective analysis involves generation of a two-dimensional linear periodic RF field on the X axis and time-of-flight division of ions on specific charge. The periodic field consists of elementary two-dimensional electric RF fields in y>0 and y<0 regions, shifted from each other on the X axis by a value x0. Analysed ions are let into the working volume of the analyser and execute oscillations in the XOY(n-2)/2 plane, closer to periodic oscillations with period 2x0. The drift time of the ions in the analyser is proportional to the mass of the particle and the number (n-2) of elementary RF fields. The method and device for mass selective division of charged particles in periodic two-dimensional linear RF fields increase the traveling time of ions in the analyser, possess the property of space-time focusing ions with different initial coordinates on X and Z axes, energies and entry angles, which improves analytical characteristics of radio-frequency time-of-flight mass-spectrometers and improve their design.

EFFECT: improved analytical, performance and application properties of time-of-flight type mass-spectrometers.

2 cl, 1 dwg

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RU 2 367 053 C1

Authors

Mamontov Evgenij Vasil'Evich

Gurov Viktor Sergeevich

Trubitsyn Andrej Afanas'Evich

Djagilev Aleksandr Aleksandrovich

Dates

2009-09-10Published

2008-06-10Filed