FIELD: physics.
SUBSTANCE: quartz monofraction is collected and its fluorescence intensity during X-ray excitation is measured with subsequent evaluation of structure imperfection. The collected quartz monofraction is pre-annealed at temperature of 350-450°C and the X-ray fluorescence spectrum of the annealed quartz recorded in spectral wavelength range of 350-550 nm and structure imperfection and quality of the quartz material is determined from the ratio of fluorescence intensity at wavelength 360-380 nm to X-ray fluorescence intensity of structural defect centres in the spectral range of 420-500 nm.
EFFECT: faster and more reliable preliminary evaluation of quality of quartz material.
1 tbl, 2 dwg
| Title | Year | Author | Number |
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| METHOD FOR SEPARATING SILVER AND COPPER MINERALS FROM OXIDATION ZONES OF SULPHIDE COMPLEX DEPOSITS | 2010 |
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