SYSTEM AND METHOD OF MEASURING AND MAPPING SURFACE RELATIVE REFERENCE MARK Russian patent published in 2011 - IPC G01B11/30 

FIELD: physics.

SUBSTANCE: system for measuring and shifting a surface relative a reference mark has scanning apparatus for generating data in form of a dense set of points, data storage apparatus for storing data on the reference mark and processing apparatus for processing said data in form of a dense set of point and said data on the reference mark. The data processing apparatus has binding apparatus and apparatus for processing data on shift. The method of measuring shift of the surface relative a reference mark involves positioning the scanning apparatus opposite the reference mark, scanning the surface, generating data in form of a dense set of points between the reference mark and the surface, determining the position of and direction of key reference parametres of the object, obtaining data on the reference mark in the given coordinate system, processing data in form of a dense set of points and said data on the reference mark, aligning data in form of dense set of points relative key reference parametres determined by data on the reference mark, converting data in form of a dense set of points into a system of coordinates, determining the shift between the surface and the reference mark.

EFFECT: high accuracy of measuring shift of a mill lining.

41 cl, 36 dwg, 1 tbl