SAMPLE AT THE HIGH-TEMPERATURE IMPACT THEREON GEOMETRICAL PARAMETERS AND / OR DEFORMATIONS MEASUREMENT METHOD AND SYSTEM FOR ITS IMPLEMENTATION Russian patent published in 2018 - IPC G01B11/16 

FIELD: measuring equipment.

SUBSTANCE: invention relates to the measuring equipment, in particular to the objects deformation parameters measuring contactless means and methods. Claimed sample under high-temperature exposure geometric parameters and / or deformations measuring system includes the high-temperature chamber made with possibility of the sample placement therein, sight glass located in the chamber wall with possibility of visual observation over it, installed inside the chamber sample illumination system, mounted on the chamber outer side photo-recording device to ensure that the sample is placed in the frame, associated with the photo-recording device computing device. Photo-recording device performs image processing, the processing results visualization and the sample three-dimensional numerical image construction, by which the geometric and deformation parameters measurement and calculation are performed by the sample boundaries in the image in pixel form coordinates calculation with their subsequent approximation by straight lines or polynomial curves, marks coordinates in the pixel form obtaining and the boundaries coordinates and the sample marks conversion into the metric form.

EFFECT: possibility of the loaded sample deformations and its shape at high temperatures non-contact measurement.

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