FIELD: physics.
SUBSTANCE: in a device for measuring permittivity and loss-angle tangent of a liquid, having a photonic crystal with periodicity of variation of the wave impedance in the direction of propagation of electromagnetic radiation, having an area with violation of periodicity, according to the solution, the photonic crystal is in form of alternating sections of a microstrip transmission line with different wave impedance values. The device also has a measuring cell for the analysed liquid in form of a section of the microstrip transmission line filled with air, lying on the area with violation of periodicity.
EFFECT: less volume of the measured liquid.
6 dwg, 2 tbl
| Title | Year | Author | Number |
|---|---|---|---|
| METHOD OF DETERMINING RELATIVE DIELECTRIC PERMEABILITY AND ANGLE TANGENT OF DIELECTRIC LOSS OF DIELECTRIC STRUCTURE | 2019 |
|
RU2716600C1 |
| ELECTROPHYSICAL MEASUREMENT METHOD FOR NANOSCALE METAL FILM ON SEMICONDUCTOR OR DIELECTRIC SUBSTRATE STRUCTURE | 2007 |
|
RU2349904C1 |
| DEVICE FOR DETERMINATION OF PARAMETERS OF METAL-DIELECTRIC STRUCTURES | 2013 |
|
RU2534728C1 |
| METHOD TO DETERMINE ELECTROCONDUCTIVITY AND THICKNESS OF SEMICONDUCTOR PLATES OR NANOMETER SEMICONDUCTOR LAYERS IN STRUCTURES "SEMICONDUCTOR LAYER - SEMICONDUCTOR SUBSTRATE" | 2012 |
|
RU2517200C2 |
| LOW-DIMENSIONAL MICROWAVE PHOTONIC CRYSTAL | 2014 |
|
RU2587405C2 |
| METHOD TO MEASURE DIELECTRIC PERMEABILITY OF MATERIALS AND DEVICE FOR ITS REALISATION | 2014 |
|
RU2548064C1 |
| METHOD OF MEASURING PARAMETERS OF SEMICONDUCTOR STRUCTURES | 2015 |
|
RU2622600C2 |
| MICROWAVE FILTER WITH CONTROLLED POSITION OF FREQUENCY TRANSMISSION BAND AREA AND VALUE OF TRANSMISSION IN THIS AREA | 2009 |
|
RU2407114C1 |
| MICROSTRIP FILTER ON SLOW-DOWN SYSTEM WITH DIELECTRIC INSERTS | 2008 |
|
RU2354015C1 |
| BROADBAND MICROSTRIP MATCHED LOAD | 2013 |
|
RU2546578C2 |
