FIELD: information technologies.
SUBSTANCE: signals from a photodetector are transformed from an analogue form into a digital one and then processed. The treatment process is subdivided into an initial, an intermediate and a final stage. The first two are executed simultaneously. At the intermediate stage a processor accumulates full-format image arrays, and processing functions are executed over them. At the initial stage - EPLD is used to execute internal functions of image processing. Results are recorded in an intermediate memory with common address and data buses relative to the processor and EPLD, and into a television memory with individual address and data buses connected to EPLD. After processing with the processor, data arrays are sent into the main memory with individual address and data buses connected to EPLD, which store coefficients of uneven sensitivity correction, coefficients of dark background correction and data of defect elements. Using the processor, any specified main memory is addressed at any specified moment of time. At the final stage, using EPLD, the data with completed correction of uneven sensitivity and dark background correction is read from the television memory, and defect elements are replaced. Then the signal is converted into an analogue form. The device comprises ADC, EPLD, a processor, DAC. Units of initial and final processing are based on EPLD. A unit of intermediate processing is based on the processor. The latter is connected to the unit of initial processing by means of the intermediate memory with common address and data buses. The unit of initial processing is equipped with the main memory, connected to EPLD, with individual address and data buses, with quantity equal to quantity of variables used in processing logics. The processor is arranged with the possibility to address any main memory. The initial processing unit is connected to the final processing unit by means of the television memory connected to EPLD.
EFFECT: expansion of functional capabilities and increased indices of throughput capacity in processing of signals.
16 cl, 1 dwg
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Authors
Dates
2011-06-27—Published
2009-12-22—Filed